Computing Robust Tests for Stuck-open Faults from Stuck-at Test Sets
نویسندگان
چکیده
An experimental system for computing robust tests for stuck-open faults in static CMOS circuits is presented. It constructs robust test-pairs from tests for stuck-at faults by identifying several classes of FETs. Robust tests for stuck-open faults in FETs belonging to these classes are constructed from any stuck-at test set by carefully constructing initialization vectors. Initialization vectors are constructed by examining the \parity" of the paths in the circuit. Robust tests for additional faults are identiied using stuck-open fault simulation. Experimental results show that the system can compute robust tests for a \very large" percentage of the stuck-open faults in a \reasonable" time.
منابع مشابه
A Method of Test Generation for Path Delay Faults Using Stuck-at Fault Test Generation Algorithms
In this paper, we propose a test generation method for non-robust path delay faults using stuck-at fault test generation algorithms. In our method, we first transform an original combinational circuit into a circuit called a partial leaf-dag using path-leaf transformation. Then we generate test patterns using a stuck-at fault test generation algorithm for stuck-at faults in the partial leaf-dag...
متن کاملEnhanced Mode of Extended Set of Target Fault Techniques in Single Stuck-at Fault for Fault Coverage in Benchmark Circuits
Considering the full scan benchmark circuit, in which the undetectable single stuck-at faults, tends to cluster in certain areas. This indicates that certain areas may remain uncovered by a test set for single stuck-at faults. The extension to the set of target faults aimed at providing a better coverage of the circuit in the presence of undetectable single stuck-at fault. The extended set of t...
متن کاملAnalytic Study of Undetectable Bridging Faults in Combinational Circuits
Physical faults include bridging faults, break (open) faults, transistor stuck-on and transistor stuck-off. Compared to traditional gate-level stuck-at faults, physical faults more closely represent realistic faults appearing at the gate level and transistor level. Analytical modelling for such faults, used for design and testability, is still a new and emerging area. Undetectable bridging faul...
متن کاملStuck-At Tuple-Detection: A Fault Model Based on Stuck-At Faults for Improved Defect Coverage
N-detection stuck-at test sets were shown to be effective in achieving high defect coverages for benchmark circuits. However, the definition of n-detection test sets allows the same set of faults to be detected by several different tests, thus potentially detecting the same defects. We propose an extension of the ndetection model that alleviates this problem by considering mtuples of faults and...
متن کاملTransistor Stuck-Open Fault Detection in Multilevel CMOS Circuits
The necessary and sufficient conditions for detecting transistor stuck-open faults in arbitrary multi-level;el CMOS circuits are show. A method for representing a twopattern test for detecting a single stud-open fault using only one cube is presented. The relationship between the D-algorithm and the conditions for detecting transistor stuck-open faults in CMOS circuits is provided. The applicat...
متن کامل